Particle Technology (Prof. Dr. Robin Klupp Taylor) - Unit 1 (Particle size, Shape and Distribution) 3.11 - Unit 1 Section 4.3 Measures of central tendency and width/ClipID:25344 vorhergehender Clip nächster Clip

Aufnahme Datum 2020-11-30

Kurs-Verknüpfung

Interface Engineering and Particle Technology (MAP Fundamentals Course) | Winter Semester

Lehrende(r)

Prof. Robin N. Klupp Taylor

Zugang

Studon

Sprache

Englisch

Einrichtung

Professur für Nanostructured Particles

Produzent

Professur für Nanostructured Particles

Format

Vorlesung

Typ

universitäre Vorlesung

Nächstes Video in Kapitel

Particle Technology (Prof. Dr. Robin Klupp Taylor) - Unit 1 (Particle size, Shape and Distribution) 3.12 - Unit 1 Section 4.4 Standard distributions
Schloss1
Prof. Robin N. Klupp Taylor
2020-11-30
Studon
Particle Technology (Prof. Dr. Robin Klupp Taylor) - Unit 1 (Particle size, Shape and Distribution) 3.13 - Unit 1 Exercise Session 1
Schloss1
Prof. Robin N. Klupp Taylor
2020-12-19
Studon
Particle Technology (Prof. Dr. Robin Klupp Taylor) - Unit 1 (Particle size, Shape and Distribution) 3.14 - Unit 1 Exercise Session 2
Schloss1
Prof. Robin N. Klupp Taylor
2020-12-19
Studon
Particle Technology (Prof. Dr. Robin Klupp Taylor) - Unit 2 (Particle Motion) 4.1 - 1.1 Introduction: Assumptions, definitions and the forces on a particle
Schloss1
Prof. Robin N. Klupp Taylor
2020-12-22
Studon
Particle Technology (Prof. Dr. Robin Klupp Taylor) - Unit 2 (Particle Motion) 4.2 - 1.2 Obtaining an expression for the drag force
Schloss1
Prof. Robin N. Klupp Taylor
2020-12-22
Studon

Mehr Videos aus der Kategorie "Technische Fakultät"

8 - Modallogik
2025-05-21
Studon
geschützte Daten  
7 - Einführung in die Algorithmik: Quicksort
2025-05-21
IdM-Anmeldung
geschützte Daten  
4 - Automotive Engineering 2
2025-05-21
Passwort / Studon
geschützte Daten  
4 - Production Technology I
2025-05-22
Studon
geschützte Daten  
4 - Symbolic Methods in Artificial Intelligence
2025-05-20
Frei
freie Daten  
4 - Knowledge Representation for Mathematical Theories
2025-05-22
Frei
freie Daten