Advanced Semiconductors Introduction: Characterization 2021 /CoursesID:2367
- Most recent entry on 2022-07-20
Keywords: carrier concentration resistivity, mobility, defect concentration, optical properties

Lecturer

Prof. Dr. Wolfgang Heiß

Organisational Unit

Professur für Werkstoffwissenschaften (lösungsprozessierte Halbleitermaterialien)

Recording type

Vorlesungsreihe

Via

IdM-login

Language

English

Videos to the course given in 2021

Associated Clips

Episode
Title
Lecturer
Updated
Via
Duration
Media
1
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Asi-Ch-lecture1
Prof. Dr. Wolfgang Heiß
2021-04-14
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01:31:35
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2
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Asi-Ch-lecture1
Prof. Dr. Wolfgang Heiß
2021-04-21
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01:26:20
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3
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Asi-Ch-lecture3
Prof. Dr. Wolfgang Heiß
2021-04-28
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01:29:38
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4
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Asi-Ch-lecture4
Prof. Dr. Wolfgang Heiß
2021-05-12
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01:23:51
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5
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Asi-Ch-lecture5
Prof. Dr. Wolfgang Heiß
2021-05-12
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01:27:11
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6
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Asi-Ch-lecture5
Prof. Dr. Wolfgang Heiß
2021-05-19
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01:24:21
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7
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Prof. Dr. Wolfgang Heiß
2021-05-26
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01:28:00
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8
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Prof. Dr. Wolfgang Heiß
2021-06-02
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01:25:56
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9
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Prof. Dr. Wolfgang Heiß
2021-06-09
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01:24:15
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10
Asi-Ch-lecture8 preview image
Asi-Ch-lecture8
Prof. Dr. Wolfgang Heiß
2021-06-16
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01:21:06
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11
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Asi-Ch-lecture8
Prof. Dr. Wolfgang Heiß
2021-06-23
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01:27:09
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12
Asi-Ch-lecture 12 preview image
Asi-Ch-lecture 12
Prof. Dr. Wolfgang Heiß
2021-06-30
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01:26:43
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13
Asi-Ch-lecture 13 preview image
Asi-Ch-lecture 13
Prof. Dr. Wolfgang Heiß
2021-07-07
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01:29:08
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14
Asi-Ch-lecture 13 preview image
Asi-Ch-lecture 13
Prof. Dr. Wolfgang Heiß
2022-07-13
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01:16:50
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15
ASIC 2022 dielectric functions preview image
ASIC 2022 dielectric functions
Prof. Dr. Wolfgang Heiß
2022-07-20
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01:23:02
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